The CD4011BE NAND gate allows system designers to directly perform the NAND gate function, supplementing the existing series of CMOS gates. All inputs and outputs are buffered.

? Propagation Delay Time = 60ns (typ.) at CL = 50pF,VDD = 10V
? Buffered Inputs and Outputs
? Standardized Symmetrical Output Characteristics
? 100% Tested for Quiescent Current at 20V
? 5V, 10V and 15V Parametric Ratings
? Maximum Input Current of 1μA at 18V Over Full Package Temperature Range; 100nA at 18V and +25°C
? Noise Margin (Over Full Package Temperature Range):
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
? Meets All Requirements of JEDEC Tentative Standards No. 13B, "Standard Specifications for Description of "B" Series CMOS Device's